The measuring methods of CMM can usually be divided into contact measurement, non-contact measurement and contact and non-contact measurement. You can visit VGS Shen Wei.

Among them, contact measurement is often used to measure machined products, pressed products and metal films. In order to analyze the machining data of workpiece or provide the original information of workpiece for reverse engineering, it is often necessary to scan the data points on the surface of workpiece with CMM. Taking CMM as an example, this paper introduces several common scanning methods and operation steps of CMM.

The scanning operation of CMM is to collect data points in a specific area on the surface of the measured object by using PC DMIS program. These data points can be straight lines, patches, sections of parts, curves of parts or circumferential lines at a certain distance from the edges. The scanning type is related to the measurement mode, probe type and whether there are CAD files. The "Scan" option on the control screen is determined by the status button (Manual /DCC). If DCC method is used for measurement and CAD files are available, the available scanning methods are "open line", "closed line", "patch", "section" and "perimeter" scanning; If there are only wireframe CAD files measured by DCC method, you can choose scanning methods such as "open linearity", "closed linearity" and "patch". If manual measurement mode is adopted, only the basic "manual TTP scanning" mode can be used; If manual measurement is adopted and rigid probe is used, the available options are Fixed Increment, Variable Increment, Time Increment and Body Axis Scan.