Main contents of the paper: The paper generally consists of title, author, abstract, key words, text, references and appendix.
Patent measurement is based on the measurement information in the patent. Through the quantitative analysis of patents, we can gain insight into the development of industry technology, identify competitors and their technical activities, and judge the competitive situation of the industry. The trend shows that patent measurement will become an organic part of information metrology and an important application tool of competitive intelligence analysis.
At present, there are many indicators to measure patents, but different indicators and combinations of indicators should be selected for different evaluation purposes. We believe that we should design different patent measurement index systems from three levels: macro (a certain field), meso (a certain company) and micro (a certain patent) by combining the index system designed by world-famous pool research companies, the indexes studied by other scholars and the relevant knowledge of document measurement. In addition to the geographical distribution, time distribution, organization distribution, cited times, average cited times, self-cited times and other basic indicators applicable to each level, each level has its own unique indicators.
1. Macro patent measurement index
Macro here refers to the patent distribution of an industry (field). Its unique indicators are: ① Technology cycle time (TCT): it refers to the median age of all patents still in use. Examining how long the patents in this field have been replaced reflects the fierce competition. ② Scientific strength (SS): refers to the absolute number of scientific documents cited by patents in this field. Investigate the absolute number of the relationship between patents and scientific literature in this field. ③ Science Relevance Degree (SL): refers to the ratio between the strength of science and the number of patents in this field. Investigate the relative quantity of the relationship between patents and scientific literature in this field.
2. Metrological indicators of medium-sized patents
The middle view here refers to observing the distribution of patents from the perspective of a company. From different analysis angles, we think that we should set different evaluation index systems from "all fields" and "specific fields". "All fields" are mainly analyzed from two indicators: the number of patents and the distribution of patent fields, which will not be repeated here. The unique indicators in "specific field" are: ① Current impact index (CII): refers to the ratio of the average cited times of a company's patents in the first five years to the average cited times of all patents in a patent system in the first five years. Investigate the impact of the company's latest patent. ② Total technical strength (TTS): the company's products and timely impact indicators in this field. Examining patent quality is a weighted index.
3. Micro-patent measurement indicators
Microscopy here refers to the measurement of patent individuals. Its unique indicators mainly include: ① patents of the same subject: reflecting the geographical distribution of patents. (2) Scientific strength: refers to the number of scientific documents of the patent cited unit. Reflects the intersection of this patent and scientific literature. (3) The time when the patent was first cited by other companies: It reflects the technical barriers of the patent. If it is quoted soon, the description is likely to be replaced, and vice versa.
The macro, meso and micro index systems of patent measurement are given respectively, and different evaluation systems should be adopted for different research purposes and research objects. Here, we should emphasize the following three points: ① Some indicators in the macro, meso and micro levels of the index system are overlapping, such as the number of patents and the number of patents cited, which are the basic indicators to measure patents. However, some indicators that we think are most suitable for a certain level are assigned to the corresponding indicator system, such as technology cycle time (TCT) indicators. Although it can also be applied to the patent measurement index at the middle level, we think it is most suitable for measuring the industrial (macro) patent distribution, so we put it into the macro evaluation index system. (2) Specific evaluation shows that the difficulty of obtaining some indicators is different, and it is not necessary to forcibly obtain all the data of each indicator. For example, the current impact index (CII) requires calculating the average citation times of all patents in the first five years of the patent system, which is undoubtedly difficult for general patent researchers to achieve. ③ Micro-level measurement index is the basis of measurement at other levels, so in specific applications, it permeates the measurement of all other patents, such as the definition and selection of highly cited patents.