Recently, the IEEE International Symposium on Reliability Physics (IRPS) published the 2020 award-winning papers. Professor Zhao Yi from School of Information and Electronic Engineering won the Best Paper Award for "Research on Self-heating Effect of Ultra-small FinFET Devices". The first author of the thesis is Qu, a doctoral student. This is the first time that a research achievement from China has won this honor, and it is also a rare paper with students as the first author in recent years.

In the past 59 years, IRPS has been the first meeting for international engineers and scientists to show their original work in the field of integrated circuit reliability, attracting participants from the United States, Europe, Asia and other parts of the world to understand the reliability of semiconductor devices, integrated circuits and microelectronic systems through the analysis of fault physics and application environment.

Based on the research results published in the 20 17 top-level conference "IEDM", Professor Zhao Yi's team developed an ultra-fast sub-nanosecond test system, which dynamically monitored the self-heating effect of advanced FinFET devices at circuit speed for the first time in the world, and applied the extracted transient temperature to the evaluation and model establishment of device reliability degradation behavior. Self-heating effect has become the most serious and concerned reliability problem in advanced process nodes of sub 10 nm integrated circuits. This research result of Professor Zhao Yi's team is not only of great significance to device research and development, but also provides a reference for circuit designers when designing circuit clocks and device layouts.

Qu, a doctoral student, has taken the lead in developing ultra-fast device testing technology in the research group since he entered the school. Without sufficient theoretical guidance and reference, he overcame many difficulties and made breakthroughs, and published his achievements in many famous international conferences such as IEDM\IRPS. At present, Zhejiang University has taken the lead in testing ultrafast devices.