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Brief introduction of thin film thickness gauge
XRF coating thickness gauge is a coating thickness gauge based on X-ray fluorescence principle. Its basic principle is as follows:

X-ray emission: the built-in X-ray source of XRF coating thickness gauge emits X-rays, which pass through the coating to be measured and act on the detector below the sample.

X-ray fluorescence reaction: the coating on the surface of the sample reacts with X-rays, releasing characteristic X-rays, and the characteristic X-ray energy is related to the coating material.

Characteristic X-ray detection: the detector receives characteristic X-rays and converts them into electrical signals, which are transmitted to the instrument through the circuit.

Calculation of coating thickness: according to the energy and intensity of characteristic X-rays, the instrument calculates the coating thickness through a predetermined algorithm and calibration curve.

XRF coating thickness gauge can realize high-precision coating thickness measurement by using X-ray fluorescence principle, and is suitable for various material types and coating systems. Its advantages include non-destructive, rapid measurement, high precision, and samples without special treatment. However, it should be noted that the measurement results of XRF coating thickness gauge may be affected by factors such as the surface smoothness of the sample and the properties of the coating material, so it is necessary to formulate appropriate sample preparation and measurement conditions in practical application.