Scientists from the U.S. Department of Energy inspected TOF-SIMS equipment in a materials science laboratory. The use of this equipment enables SQMS scientists to study the impurities in superconducting qubits with one millionth accuracy, and the noise of quantum decoherence will limit the storage life of quantum information. This phenomenon has a negative impact on the performance of quantum computers that rely on quantum information for calculation. When scientists successfully produce quantum bits that are less affected by quantum decoherence sources, the power of quantum computers will be released, and scientists will have a new tool to perform calculations that are difficult or impossible for classical computers to solve.
Quantum computer aims to solve the problem of needing a lot of memory. By using a quantum mechanical property called entanglement, these computers will be able to analyze systems containing a large amount of data, such as traffic patterns, weather forecasts, financial modeling and so on.
"In superconducting qubits, we always want to know which potential material properties will affect the performance of quantum computers." The director of quantum materials of the US Department of Energy said. "Now, researchers at SQMS have been able to check Rigetti equipment with high-precision analysis equipment to find potential defective systems that we have never explored before." The impurities found in the materials constituting superconducting qubits can be attributed to quantum decoherence, which was emphasized by American scientists in a published paper.
TOF-SIMS is used to analyze the three-dimensional data of hydrocarbon impurity distribution in superconducting qubit samples. Through the three-dimensional analysis of quantum bits at the atomic level, American scientists found impurities including oxygen, hydrogen, carbon, chlorine, fluorine, sodium, magnesium and calcium. In order to find these impurities, scientists used a device called TOF-SIMS binary time vacuum ion mass spectrometer, which can quickly emit a qubit ion and chop it up. The ions cut from the qubit surface are analyzed in the sensor in the instrument, and the identification accuracy of the constituent elements can reach one millionth.
Scientists explained: "As a part of the center, our initial goal is to accurately determine the impurities and defects in qubit samples. Once we get this information, we can formulate strategies to remove these impurities and improve the performance of quantum computers. TOF-SIMS instrument was originally purchased for the US military's superconducting radio frequency research project, which is used to identify impurities in the accelerator cavity and propel particles in the particle accelerator. Now, TOF-SIMS device is used to analyze qubits for the first time. Impurities in accelerator cavity materials can also affect performance, which makes the instrument suitable for SQMS scientists, who are also identifying impurities in materials, which will damage other superconducting technologies. "
The scientist explained: "Our initial goal was to accurately determine the impurities and defects in the sample. Once we get this information, we can formulate strategies to eliminate these impurities and improve performance. " TOF-SIMS identifies atoms from the top layer, etches qubits to generate three-dimensional profiles of elements and compounds that make up qubits, and determines the positions and types of impurities. Quantum bits can be fabricated by depositing a layer of superconducting niobium on silicon. Scientists evaporate niobium into gas, just as water vapor forms ice on cold metal in winter, niobium will solidify and form a thin film on silicon.
Scientists have explained that the original cavity integrating niobium, or the structure of niobium atoms on thin films, may lead to impurities on quantum sites. From the point of view of materials and methods, TOF-SIMS analysis can be used to improve the process of generating qubits.
More importantly, this part of the technology is ready for decentralization. The chief commercialization officer and director of the technology transfer office of the US Department of Energy visited the laboratory together with the chief technology officer of a national laboratory. They talked about materials research, the use of TOF-SIMS equipment and the technology transfer opportunities of SQMS.
After writing this article, I want to say a few words. It is too complicated. I finally finished it. I must understand what this means before I can write. This part takes the longest time. Haha, this breakthrough is true. ...